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Predicting Photovoltaic Module Lifespan Based on Combined Stress Tests and Latent Heat Analysis

Author

Listed:
  • Woojun Nam

    (Next Generation Photovoltaic Module and Power System Research Center, Konkuk University, Seoul 05029, Republic of Korea)

  • Jinho Choi

    (Next Generation Photovoltaic Module and Power System Research Center, Konkuk University, Seoul 05029, Republic of Korea)

  • Gyugwang Kim

    (Next Generation Photovoltaic Module and Power System Research Center, Konkuk University, Seoul 05029, Republic of Korea)

  • Jinhee Hyun

    (Next Generation Photovoltaic Module and Power System Research Center, Konkuk University, Seoul 05029, Republic of Korea)

  • Hyungkeun Ahn

    (Next Generation Photovoltaic Module and Power System Research Center, Konkuk University, Seoul 05029, Republic of Korea)

  • Neungsoo Park

    (The Department of Computer Science & Engineering, Konkuk University, Seoul 05029, Republic of Korea)

Abstract

In this study, long-term reliability tests for high-power-density photovoltaic (PV) modules were introduced and analyzed in accordance with IEC 61215 and light-combined damp heat cycles, such as DIN 75220. The results indicated that post light soaking procedure, light-combined damp heat cycles caused a 3.51% power drop, while IEC standard tests (DH1000 and TC200) caused only 0.87% and 1.32% power drops, respectively. IEC 61215 failed to assess the long-term reliability of the high-power-density PV module, such as the passivated emitter rear cell. Additionally, based on the combined test, the latent heat ( Q m o d ) of the module was introduced to predict its degradation rate and to fit the prediction curve of the product guaranteed by the PV module manufacturers. Q m o d facilitates in predicting a PV module’s lifespan according to the environmental factors of the actual installation area. The Q m o d values of the PV stations in water environments, such as floating and/or marine PVs, indicated that they would last 7.2 years more than those on a rooftop, assuming that latent heat is the only cause of deterioration. Therefore, extending module life and improving power generation efficiency by determining installation sites to minimize latent heat would be advantageous.

Suggested Citation

  • Woojun Nam & Jinho Choi & Gyugwang Kim & Jinhee Hyun & Hyungkeun Ahn & Neungsoo Park, 2025. "Predicting Photovoltaic Module Lifespan Based on Combined Stress Tests and Latent Heat Analysis," Energies, MDPI, vol. 18(2), pages 1-16, January.
  • Handle: RePEc:gam:jeners:v:18:y:2025:i:2:p:304-:d:1565053
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