Author
Listed:
- Zhen-Peng Zhang
(China Electric Power Research Institute, No.143 Luoyu Road, Hongshan District, Wuhan 430074, China)
- Chang-Ji Zheng
(Key Laboratory of Engineering Dielectrics and Its Application Ministry of Education, School of Electrical and Electronic Engineering, Harbin University of Science and Technology, Harbin 150080, China)
- Mei Zheng
(State Grid Zhejiang Electric Power Co. Ltd, Hangzhou 310000, China)
- Hong Zhao
(Key Laboratory of Engineering Dielectrics and Its Application Ministry of Education, School of Electrical and Electronic Engineering, Harbin University of Science and Technology, Harbin 150080, China)
- Jian-Kang Zhao
(China Electric Power Research Institute, No.143 Luoyu Road, Hongshan District, Wuhan 430074, China)
- Wei-Feng Sun
(Key Laboratory of Engineering Dielectrics and Its Application Ministry of Education, School of Electrical and Electronic Engineering, Harbin University of Science and Technology, Harbin 150080, China)
- Jun-Qi Chen
(Key Laboratory of Engineering Dielectrics and Its Application Ministry of Education, School of Electrical and Electronic Engineering, Harbin University of Science and Technology, Harbin 150080, China)
Abstract
As a key accessory of high-voltage (HV) insulated submarine cable, the factory joints of the cross-linked polyethylene (XLPE) represent an unpredictable uncertainty in cable-connecting fabrications by means of the extruded molding joint (EMJ) technique. The electrical breakdown pathways formed at the interfaces between recovery insulation and cable body under alternative current 500 kV voltages are specifically investigated by microstructure characterizations in combination with the electric field and fractal simulations. Dielectric-defected cracks in tens of micrometers in insulation interfaces are identified as the strings of voids, which dominate insulation damages. The abnormal arrangements of XLPE lamellae from scanning electron microscopy (SEM) imply that the structural micro-cracks will be formed under interface stresses. Electrical-tree inception is expedited to a faster propagation due to the poor dielectric property of interface region, manifesting as 30% lower of tree inception voltage. The longer free-paths for accelerating charge carriers in the cracks of interface region will stimulate partial discharging from needle electrodes. The carbonized discharging micro-channels arising in interface region illustrate that the partial discharging will be triggered by the electrical-trees growing preferentially along the defect cracks and could finally develop into insulation damages. The mechanism of forming cracks in the fusion processes between the molten XLPE of cable body and the molten cross-linkable PE of recovery insulation is elucidated, according to which the crack-caused degradation of insulation performance is expected to be alleviated.
Suggested Citation
Zhen-Peng Zhang & Chang-Ji Zheng & Mei Zheng & Hong Zhao & Jian-Kang Zhao & Wei-Feng Sun & Jun-Qi Chen, 2020.
"Interface Damages of Electrical Insulation in Factory Joints of High Voltage Submarine Cables,"
Energies, MDPI, vol. 13(15), pages 1-14, July.
Handle:
RePEc:gam:jeners:v:13:y:2020:i:15:p:3892-:d:392177
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Cited by:
- Songyuan Li & Pengxian Song & Zhanpeng Wei & Xu Li & Qinghua Tang & Zhengzheng Meng & Ji Li & Songtao Liu & Yuhuai Wang & Jin Li, 2022.
"Partial Discharge Detection and Defect Location Method in GIS Cable Terminal,"
Energies, MDPI, vol. 16(1), pages 1-10, December.
- Luca Barbieri & Andrea Villa & Roberto Malgesini & Daniele Palladini & Christian Laurano, 2021.
"An Innovative Sensor for Cable Joint Monitoring and Partial Discharge Localization,"
Energies, MDPI, vol. 14(14), pages 1-12, July.
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