Quality assurance in the EPO Patent Information Resource
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Cited by:
- Jurriën Bakker, 2017. "The log-linear relation between patent citations and patent value," Scientometrics, Springer;Akadémiai Kiadó, vol. 110(2), pages 879-892, February.
- Jurriën Bakker & Dennis Verhoeven & Lin Zhang & Bart Van Looy, 2016.
"Patent citation indicators: One size fits all?,"
Scientometrics, Springer;Akadémiai Kiadó, vol. 106(1), pages 187-211, January.
- Jurriën Bakker & Dennis Verhoeven & Lin Zhang & Bart Van Looy, 2016. "Patent citation indicators: One size fits all?," Working Papers of Department of Management, Strategy and Innovation, Leuven 545092, KU Leuven, Faculty of Economics and Business (FEB), Department of Management, Strategy and Innovation, Leuven.
- Jurriën Bakker & Dennis Verhoeven & Lin Zhang & Bart Van Looy, 2016. "Patent citation indicators: One size fits all?," Working Papers of ECOOM - Centre for Research and Development Monitoring 545092, KU Leuven, Faculty of Economics and Business (FEB), ECOOM - Centre for Research and Development Monitoring.
- Kok, Holmer & Faems, Dries & de Faria, Pedro, 2020. "Ties that matter: The impact of alliance partner knowledge recombination novelty on knowledge utilization in R&D alliances," Research Policy, Elsevier, vol. 49(7).
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Quality assurance EPO Patent Information Resource PIR Master databases Data standardisation DOCDB REFI FTM MCD ECLA NPL OPS Classification data Citation data Examiner workflow INPADOC Patent families RID Reference identifier;Statistics
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