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Thin and thick points for branching measure on a Galton-Watson tree

Author

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  • Mörters, Peter
  • Shieh, Narn-Rueih

Abstract

Suppose that [mu] is the branching measure on the boundary of a supercritical Galton-Watson tree with offspring distribution N such that E[N log+ N]

Suggested Citation

  • Mörters, Peter & Shieh, Narn-Rueih, 2002. "Thin and thick points for branching measure on a Galton-Watson tree," Statistics & Probability Letters, Elsevier, vol. 58(1), pages 13-22, May.
    • Handle: RePEc:eee:stapro:v:58:y:2002:i:1:p:13-22
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    References listed on IDEAS

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    1. Shieh, Narn-Rueih & Taylor, S. James, 1998. "Logarithmic multifractal spectrum of stable occupation measure," Stochastic Processes and their Applications, Elsevier, vol. 75(2), pages 249-261, July.
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