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Atomic force microscopy study of FG-annealed and PECVD silicon nitride AR-coated silicon solar cells

Author

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  • Kishore, R.
  • Moutinho, H.R.
  • Sopori, B.L.

Abstract

Atomic force microscopy has been used to study the surface structure and roughness of PECVD silicon nitride coated silicon solar cells. The surface roughness increases in some areas of the solar cells after forming gas annealing. It may be one of the reasons for better light absorption on the surface of the solar cells resulting in better solar cell performance.

Suggested Citation

  • Kishore, R. & Moutinho, H.R. & Sopori, B.L., 1995. "Atomic force microscopy study of FG-annealed and PECVD silicon nitride AR-coated silicon solar cells," Renewable Energy, Elsevier, vol. 6(5), pages 589-591.
    • Handle: RePEc:eee:renene:v:6:y:1995:i:5:p:589-591
    DOI: 10.1016/0960-1481(95)00054-N
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