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The effect of the series resistance on the photovoltaic properties of In-doped CdTe(p) thin film homojunction structure

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  • Mohamed, W.F.
  • Shehathah, Maan Ahmed

Abstract

The photovoltaic properties of In-doped CdTe(p) thin film homojunction structure have been investigated; the effect of the series resistance on the short circuit current has especially been discussed in detail. A simulation of the fabricated device is achieved successfully using the PSPICE computer program. Mathematical derivations are implemented in order to interpret the results. It is found that the deteriorative effect of the series resistance on the short circuit current vs light intensity characteristics increases by increasing the light intensity. A new factor has been suggested to be a measure of how the series resistance affects the solar cell behavior at low and high light intensities.

Suggested Citation

  • Mohamed, W.F. & Shehathah, Maan Ahmed, 2000. "The effect of the series resistance on the photovoltaic properties of In-doped CdTe(p) thin film homojunction structure," Renewable Energy, Elsevier, vol. 21(2), pages 141-152.
    • Handle: RePEc:eee:renene:v:21:y:2000:i:2:p:141-152
    DOI: 10.1016/S0960-1481(00)00008-2
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    Cited by:

    1. Mohammed, W.F. & Ahmed Shehathah Yousif, Ma'an, 2002. "The electrical properties of post-deposition annealed and as-deposited In-doped CdTe thin films," Renewable Energy, Elsevier, vol. 26(2), pages 285-294.

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