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The binomial failure rate common-cause model with WinBUGS

Author

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  • Atwood, Corwin L.
  • Kelly, Dana L.

Abstract

The binomial failure rate (BFR) common-cause model was introduced in the 1970s, but has not been used much recently. It turns out to be very easy to use with WinBUGS, a free, widely used Markov chain Monte Carlo (MCMC) program for Bayesian estimation. This fact recommends it in situations when failure data are available, especially when few failures have been observed. This article explains how to use it both for standby equipment that may fail to operate when demanded and for running equipment that may fail at random times. Example analyses are given and discussed.

Suggested Citation

  • Atwood, Corwin L. & Kelly, Dana L., 2009. "The binomial failure rate common-cause model with WinBUGS," Reliability Engineering and System Safety, Elsevier, vol. 94(5), pages 990-999.
    • Handle: RePEc:eee:reensy:v:94:y:2009:i:5:p:990-999
    DOI: 10.1016/j.ress.2008.11.007
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    Cited by:

    1. Nguyen, H.D. & Gouno, E., 2020. "Bayesian inference for Common cause failure rate based on causal inference with missing data," Reliability Engineering and System Safety, Elsevier, vol. 197(C).
    2. Nguyen, H.D. & Gouno, E., 2019. "Maximum likelihood and Bayesian inference for common-cause of failure model," Reliability Engineering and System Safety, Elsevier, vol. 182(C), pages 56-62.
    3. Mi, Jinhua & Beer, Michael & Li, Yan-Feng & Broggi, Matteo & Cheng, Yuhua, 2020. "Reliability and importance analysis of uncertain system with common cause failures based on survival signature," Reliability Engineering and System Safety, Elsevier, vol. 201(C).
    4. Zheng, Xiaoyu & Yamaguchi, Akira & Takata, Takashi, 2013. "α-Decomposition for estimating parameters in common cause failure modeling based on causal inference," Reliability Engineering and System Safety, Elsevier, vol. 116(C), pages 20-27.
    5. Fan, Mengfei & Zeng, Zhiguo & Zio, Enrico & Kang, Rui & Chen, Ying, 2018. "A stochastic hybrid systems model of common-cause failures of degrading components," Reliability Engineering and System Safety, Elsevier, vol. 172(C), pages 159-170.

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