IDEAS home Printed from https://ideas.repec.org/a/eee/reensy/v92y2007i2p223-230.html
   My bibliography  Save this article

Estimation of exponential component reliability from uncertain life data in series and parallel systems

Author

Listed:
  • Tan, Zhibin

Abstract

Estimating reliability of components in series and parallel systems from masking system testing data has been studied. In this paper we take into account a second type of uncertainty: censored lifetime, when system components have constant failure rates. To efficiently estimate failure rates of system components in presence of combined uncertainty, we propose a useful concept for components: equivalent failure and equivalent lifetime. For a component in a system with known status and lifetime, its equivalent failure is defined as its conditional failure probability and its equivalent lifetime is its expectation of lifetime. For various uncertainty scenarios, we derive equivalent failures and test times for individual components in both series and parallel systems. An efficient EM algorithm is formulated to estimate component failure rates. Two numerical examples are presented to illustrate the application of the algorithm.

Suggested Citation

  • Tan, Zhibin, 2007. "Estimation of exponential component reliability from uncertain life data in series and parallel systems," Reliability Engineering and System Safety, Elsevier, vol. 92(2), pages 223-230.
    • Handle: RePEc:eee:reensy:v:92:y:2007:i:2:p:223-230
    DOI: 10.1016/j.ress.2005.12.010
    as

    Download full text from publisher

    File URL: http://www.sciencedirect.com/science/article/pii/S0951832006000032
    Download Restriction: Full text for ScienceDirect subscribers only
    File URL: https://libkey.io/10.1016/j.ress.2005.12.010?utm_source=ideas
    LibKey link: if access is restricted and if your library uses this service, LibKey will redirect you to where you can use your library subscription to access this item
    ---><---

    As the access to this document is restricted, you may want to search for a different version of it.

    Citations

    Citations are extracted by the CitEc Project, subscribe to its RSS feed for this item.
    as


    Cited by:

    1. Sarhan, Ammar M. & Kundu, Debasis, 2008. "Bayes estimators for reliability measures in geometric distribution model using masked system life test data," Computational Statistics & Data Analysis, Elsevier, vol. 52(4), pages 1821-1836, January.
    2. Eryilmaz, Serkan, 2011. "Estimation in coherent reliability systems through copulas," Reliability Engineering and System Safety, Elsevier, vol. 96(5), pages 564-568.
    3. Tan, Zhibin, 2009. "A new approach to MLE of Weibull distribution with interval data," Reliability Engineering and System Safety, Elsevier, vol. 94(2), pages 394-403.

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:eee:reensy:v:92:y:2007:i:2:p:223-230. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    We have no bibliographic references for this item. You can help adding them by using this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Catherine Liu (email available below). General contact details of provider: https://www.journals.elsevier.com/reliability-engineering-and-system-safety .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.