Weibull and lognormal Taguchi analysis using multiple linear regression
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DOI: 10.1016/j.ress.2015.08.004
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References listed on IDEAS
- Das, Rabindra Nath & Kim, Jinseog & Park, Jeong-Soo, 2015. "Robust D-optimal designs under correlated error, applicable invariantly for some lifetime distributions," Reliability Engineering and System Safety, Elsevier, vol. 136(C), pages 92-100.
- Besseris, George J., 2010. "A methodology for product reliability enhancement via saturated–unreplicated fractional factorial designs," Reliability Engineering and System Safety, Elsevier, vol. 95(7), pages 742-749.
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Cited by:
- Wang, Guodong & He, Zhen & Xue, Li & Cui, Qingan & Lv, Shanshan & Zhou, Panpan, 2017. "Bootstrap analysis of designed experiments for reliability improvement with a non-constant scale parameter," Reliability Engineering and System Safety, Elsevier, vol. 160(C), pages 114-121.
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Keywords
Taguchi method; Weibull analysis; Accelerated life testing analysis; Multiple linear regression;All these keywords.
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