A mathematical programming approach for optimizing control plans in semiconductor manufacturing
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DOI: 10.1016/j.ijpe.2014.11.004
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References listed on IDEAS
- Vits, Jeroen & Gelders, Ludo & Pintelon, Liliane, 2006. "Production process changes: A dynamic programming approach to manage effective capacity and experience," International Journal of Production Economics, Elsevier, vol. 104(2), pages 473-481, December.
- Ho, Linda Lee & Trindade, Anderson Laécio Galindo, 2009. "Economic design of an X chart for short-run production," International Journal of Production Economics, Elsevier, vol. 120(2), pages 613-624, August.
- Chien, Chen-Fu & Wang, Hung-Ju & Wang, Min, 2007. "A UNISON framework for analyzing alternative strategies of IC final testing for enhancing overall operational effectiveness," International Journal of Production Economics, Elsevier, vol. 107(1), pages 20-30, May.
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Cited by:
- Dauzère-Pérès, Stéphane & Hassoun, Michael, 2020. "On the importance of variability when managing metrology capacity," European Journal of Operational Research, Elsevier, vol. 282(1), pages 267-276.
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Keywords
Control plan; Semiconductor manufacturing; Dynamic sampling; Risk; Defectivity; Integer linear programming;All these keywords.
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