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Process capability monitoring chart with an application in the silicon-filler manufacturing process

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  • Chen, K.S.
  • Yu, K.T.
  • Sheu, S.H.

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  • Chen, K.S. & Yu, K.T. & Sheu, S.H., 2006. "Process capability monitoring chart with an application in the silicon-filler manufacturing process," International Journal of Production Economics, Elsevier, vol. 103(2), pages 565-571, October.
    • Handle: RePEc:eee:proeco:v:103:y:2006:i:2:p:565-571
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    References listed on IDEAS

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    1. W. L. Pearn, 1998. "New generalization of process capability index Cpk," Journal of Applied Statistics, Taylor & Francis Journals, vol. 25(6), pages 801-810.
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    Cited by:

    1. Peruchi, Rogério Santana & Balestrassi, Pedro Paulo & de Paiva, Anderson Paulo & Ferreira, João Roberto & de Santana Carmelossi, Michele, 2013. "A new multivariate gage R&R method for correlated characteristics," International Journal of Production Economics, Elsevier, vol. 144(1), pages 301-315.
    2. Sabri-Laghaie, Kamyar & Fathi, Mahdi & Zio, Enrico & Mazhar, Maryam, 2022. "A novel reliability monitoring scheme based on the monitoring of manufacturing quality error rates," Reliability Engineering and System Safety, Elsevier, vol. 217(C).
    3. Wei Lo & Chun-Ming Yang & Kuei-Kuei Lai & Shao-Yu Li & Chi-Han Chen, 2021. "Developing a Novel Fuzzy Evaluation Model by One-Sided Specification Capability Indices," Mathematics, MDPI, vol. 9(10), pages 1-11, May.

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