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Theoretical determination of the thickness of a liquid-vapour interface

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  • Lekner, J.
  • Henderson, J.R.

Abstract

We compare eight possible definitions of the surface thickness for two density profiles. One definition is eliminated, and then the 10–90 thickness t is shown to be in satisfactory agreement with the other six. Our earlier work on the liquid-vapour interface is taken further, with a physical interpretation of the slowly varying density limit for the surface energy ∈; an improved estimate of t using experimental values of ∈ and the bulk energy; and an estimate of t using experimental values of ∈ and the surface tension. We obtain t ≈ 1.3d (d is the atomic diameter) for Ar, Kr and Xe near their triple points. A comparison is made with other estimates for t/d. These vary from 1 to above 3. Our results are in best agreement with Monte-Carlo simulations of the interface. The results for liquid 4He at zero temperature are discussed briefly.

Suggested Citation

  • Lekner, J. & Henderson, J.R., 1978. "Theoretical determination of the thickness of a liquid-vapour interface," Physica A: Statistical Mechanics and its Applications, Elsevier, vol. 94(3), pages 545-558.
    • Handle: RePEc:eee:phsmap:v:94:y:1978:i:3:p:545-558
    DOI: 10.1016/0378-4371(78)90086-9
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    References listed on IDEAS

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    1. Rao, A. S., 1973. "Buffer Storage Location Under Economics of Scale," Indian Journal of Agricultural Economics, Indian Society of Agricultural Economics, vol. 28(3), July.
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