Texture analysis by fractal descriptors over the wavelet domain using a best basis decomposition
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DOI: 10.1016/j.physa.2015.10.031
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- Florindo, João B. & Sikora, Mariana S. & Pereira, Ernesto C. & Bruno, Odemir M., 2013. "Characterization of nanostructured material images using fractal descriptors," Physica A: Statistical Mechanics and its Applications, Elsevier, vol. 392(7), pages 1694-1701.
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Keywords
Pattern recognition; Fractal descriptors; Wavelet transform; Best basis selection; Texture analysis;All these keywords.
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