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Surface optical reflectance spectroscopies: Application to semiconductor and metal surfaces

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  • Borensztein, Yves

Abstract

The optical response of the surface of a crystal differs from the bulk response. The origin of such differences can be either intrinsic or extrinsic. In order to illustrate these aspects, several experimental results obtained by differential reflectance spectroscopy and by reflectance anisotropy spectroscopy, on both semiconductor and metal surfaces and interfaces are presented and discussed: the influence of roughness (with the possibility of surface-plasmon excitation in the case of metal surfaces), anisotropy effects on noble metals, gas chemisorption and metal growth on semiconductor surfaces.

Suggested Citation

  • Borensztein, Yves, 1994. "Surface optical reflectance spectroscopies: Application to semiconductor and metal surfaces," Physica A: Statistical Mechanics and its Applications, Elsevier, vol. 207(1), pages 293-301.
    • Handle: RePEc:eee:phsmap:v:207:y:1994:i:1:p:293-301
    DOI: 10.1016/0378-4371(94)90387-5
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    References listed on IDEAS

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    1. Jebari, M. & Borensztein, Y. & Vuye, G., 1989. "Anomalous optical absorption in porous metal films," Physica A: Statistical Mechanics and its Applications, Elsevier, vol. 157(1), pages 371-376.
    2. Bertrand Mareschal & Maher Abu-Taleb & Jonathan Deason & Elias Salameh, 1992. "Multiobjective decision support for water resources planning," ULB Institutional Repository 2013/9345, ULB -- Universite Libre de Bruxelles.
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