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Optical properties of thin films on rough surfaces

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  • Wind, M.M.
  • Vlieger, J.

Abstract

The general theory, of second order in the film thickness and surface roughness over the wavelength, developed in an earlier paper on the optical properties of thin films, is applied in the limit that the correlation length of the surface roughness is much larger than the wavelength of light. The reflectance, transmittance and ellipsometric coefficient are calculated in this limit and the results are compared with those obtained by Ohlídal and co-workers in the same limit. It is proved that the difference in results found is a direct consequence of the neglect of local curvature of the rough surface by these authors, which is an inconsistent approximation in the second order theory.

Suggested Citation

  • Wind, M.M. & Vlieger, J., 1985. "Optical properties of thin films on rough surfaces," Physica A: Statistical Mechanics and its Applications, Elsevier, vol. 131(1), pages 1-34.
    • Handle: RePEc:eee:phsmap:v:131:y:1985:i:1:p:1-34
    DOI: 10.1016/0378-4371(85)90077-9
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    References listed on IDEAS

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    1. Albano, A.M. & Bedeaux, D. & Vlieger, J., 1980. "On the description of interfacial electromagnetic properties using singular fields, charge density and currents at a dividing surface," Physica A: Statistical Mechanics and its Applications, Elsevier, vol. 102(1), pages 105-119.
    2. Wind, M.M. & Vlieger, J., 1984. "Optical properties of thin films on rough surfaces," Physica A: Statistical Mechanics and its Applications, Elsevier, vol. 125(1), pages 75-104.
    3. Zielinska, B.J.A. & Bedeaux, D. & Vlieger, J., 1981. "Electric and magnetic susceptibilities for a fluid-fluid interface; The ellipsometric coefficient," Physica A: Statistical Mechanics and its Applications, Elsevier, vol. 107(1), pages 91-108.
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