Assessing the lifetime performance index of products from progressively type II right censored data using Burr XII model
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DOI: 10.1016/j.matcom.2008.12.001
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References listed on IDEAS
- Li, Xiuchun & Shi, Yimin & Wei, Jieqiong & Chai, Jian, 2007. "Empirical Bayes estimators of reliability performances using LINEX loss under progressively Type-II censored samples," Mathematics and Computers in Simulation (MATCOM), Elsevier, vol. 73(5), pages 320-326.
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Cited by:
- Mohammad Vali Ahmadi & Jafar Ahmadi & Mousa Abdi, 2019. "Evaluating the lifetime performance index of products based on generalized order statistics from two-parameter exponential model," International Journal of System Assurance Engineering and Management, Springer;The Society for Reliability, Engineering Quality and Operations Management (SREQOM),India, and Division of Operation and Maintenance, Lulea University of Technology, Sweden, vol. 10(2), pages 251-275, April.
- Laumen Benjamin & Cramer Erhard, 2015. "Likelihood Inference for the Lifetime Performance Index under Progressive Type-II Censoring," Stochastics and Quality Control, De Gruyter, vol. 30(2), pages 59-73, December.
- Tzong-Ru Tsai & Hua Xin & Ya-Yen Fan & Yuhlong Lio, 2022. "Bias-Corrected Maximum Likelihood Estimation and Bayesian Inference for the Process Performance Index Using Inverse Gaussian Distribution," Stats, MDPI, vol. 5(4), pages 1-18, November.
- Jianping Zhu & Hua Xin & Chenlu Zheng & Tzong-Ru Tsai, 2021. "Inference for the Process Performance Index of Products on the Basis of Power-Normal Distribution," Mathematics, MDPI, vol. 10(1), pages 1-14, December.
- Mohammad Vali Ahmadi & Mahdi Doostparast & Jafar Ahmadi, 2015. "Statistical inference for the lifetime performance index based on generalised order statistics from exponential distribution," International Journal of Systems Science, Taylor & Francis Journals, vol. 46(6), pages 1094-1107, April.
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Keywords
Process capability analysis; Progressively type II right censored sample; Maximum likelihood estimator; Burr XII distribution;All these keywords.
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