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Nonlinear dynamics of atomic force microscopy with intermittent contact

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  • Zhang, Yin
  • Zhao, Ya-pu

Abstract

When the atomic force microscopy (AFM) in tapping mode is in intermittent contact with a soft substrate, the contact time can be a significant portion of a cycle, resulting in invalidity of the impact oscillator model, where the contact time is assumed to be infinitely small. Furthermore, we demonstrate that the AFM intermittent contact with soft substrate can induce the motion of higher modes in the AFM dynamic response. Traditional ways of modeling AFM (one degree of freedom (DOF) system or single mode analysis) are shown to have serious mistakes when applied to this kind of problem. A more reasonable displacement criterion on contact is proposed, where the contact time is a function of the mechanical properties of AFM and substrate, driving frequencies/amplitude, initial conditions, etc. Multi-modal analysis is presented and mode coupling is also shown.

Suggested Citation

  • Zhang, Yin & Zhao, Ya-pu, 2007. "Nonlinear dynamics of atomic force microscopy with intermittent contact," Chaos, Solitons & Fractals, Elsevier, vol. 34(4), pages 1021-1024.
    • Handle: RePEc:eee:chsofr:v:34:y:2007:i:4:p:1021-1024
    DOI: 10.1016/j.chaos.2006.03.125
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    Cited by:

    1. Pishkenari, Hossein Nejat & Behzad, Mehdi & Meghdari, Ali, 2008. "Nonlinear dynamic analysis of atomic force microscopy under deterministic and random excitation," Chaos, Solitons & Fractals, Elsevier, vol. 37(3), pages 748-762.

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