IDEAS home Printed from https://ideas.repec.org/a/eee/chsofr/v104y2017icp495-502.html
   My bibliography  Save this article

Two-stage method for fractal dimension calculation of the mechanical equipment rough surface profile based on fractal theory

Author

Listed:
  • Liu, Yao
  • Wang, Yashun
  • Chen, Xun
  • Zhang, Chunhua
  • Tan, Yuanyuan

Abstract

The determination of fractal dimension of rough surface profile curve is important for characterizing the fractal features of rough surface microscopic topography. There are many methods to calculate the fractal dimension, such as the power spectrum method (PSM), the structure function method (SFM), the variation method, the R/S analysis method, the wavelet transform method and etc., among which the PSM and SFM are widely used methods. This study aims to improve the computational accuracy of the fractal dimension of the profile curve. For this purpose, the two-stage method based on PSM and SFM are proposed. Firstly, we analyze the principle of calculating the fractal dimension of profile curve using PSM and SFM. Then, based on PSM and SFM, we propose a two-stage method for determining the fractal dimension of profile curve. Simulation results show that the two-stage method for fractal dimension of profile curve can greatly reduce the error compared with the original PSM and SFM. Finally, the fractal dimensions of the profile curve of the cuboid specimen are calculated by the original PSM and SFM and the two-stage method respectively. The experimental results show that the proposed method provides more precise results for determining the fractal dimension.

Suggested Citation

  • Liu, Yao & Wang, Yashun & Chen, Xun & Zhang, Chunhua & Tan, Yuanyuan, 2017. "Two-stage method for fractal dimension calculation of the mechanical equipment rough surface profile based on fractal theory," Chaos, Solitons & Fractals, Elsevier, vol. 104(C), pages 495-502.
  • Handle: RePEc:eee:chsofr:v:104:y:2017:i:c:p:495-502
    DOI: 10.1016/j.chaos.2017.09.012
    as

    Download full text from publisher

    File URL: http://www.sciencedirect.com/science/article/pii/S0960077917303806
    Download Restriction: Full text for ScienceDirect subscribers only

    File URL: https://libkey.io/10.1016/j.chaos.2017.09.012?utm_source=ideas
    LibKey link: if access is restricted and if your library uses this service, LibKey will redirect you to where you can use your library subscription to access this item
    ---><---

    As the access to this document is restricted, you may want to search for a different version of it.

    Citations

    Citations are extracted by the CitEc Project, subscribe to its RSS feed for this item.
    as


    Cited by:

    1. Roman Kaminskiy & Nataliya Shakhovska & Jana Kajanová & Yurii Kryvenchuk, 2021. "Method of Distinguishing Styles by Fractal and Statistical Indicators of the Text as a Sequence of the Number of Letters in Its Words," Mathematics, MDPI, vol. 9(19), pages 1-16, September.
    2. Zhang, Shuai & Li, Yingjun & Wang, Guicong & Qi, Zhenguang & Zhou, Yuanqin, 2024. "A novel method for calculating the fractal dimension of three-dimensional surface topography on machined surfaces," Chaos, Solitons & Fractals, Elsevier, vol. 180(C).
    3. Liu, Yao & Wang, Yashun & Chen, Xun & Yu, Huangchao, 2018. "A spherical conformal contact model considering frictional and microscopic factors based on fractal theory," Chaos, Solitons & Fractals, Elsevier, vol. 111(C), pages 96-107.
    4. Chen, Zhiying & Liu, Yong & Zhou, Ping, 2018. "A comparative study of fractal dimension calculation methods for rough surface profiles," Chaos, Solitons & Fractals, Elsevier, vol. 112(C), pages 24-30.
    5. Zuo, Xue & Tang, Xiang & Zhou, Yuankai, 2020. "Influence of sampling length on estimated fractal dimension of surface profile," Chaos, Solitons & Fractals, Elsevier, vol. 135(C).

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:eee:chsofr:v:104:y:2017:i:c:p:495-502. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    We have no bibliographic references for this item. You can help adding them by using this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Thayer, Thomas R. (email available below). General contact details of provider: https://www.journals.elsevier.com/chaos-solitons-and-fractals .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.