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Selection of Bayesian Single Sampling Attributes Plans Based on Polya Distribution

Author

Listed:
  • Rajagopal K.

    (Department of Mathematics, Sri Vasavi College, Erode 638 316, India. krajstat63@yahoo.com)

  • Loganathan A.

    (Department of Statistics, Manonmaniam Sundaranar University, Tirunelveli 627 012, India. aln_24@rediffmail.com)

  • Vijayaraghavan R.

    (Department of Statistics, Bharathiar University, Coimbatore 641 046, India. rvijayrn@yahoo.com)

Abstract

Acceptance sampling plans by attributes involving sampling from the binomial distribution and the process average fraction nonconforming following a beta distribution are termed as Polya sampling plans. An iterative procedure of finding the parameters of a single sampling plan by attributes under Polya distribution satisfying given conditions with respect to producer's and consumers's risks is presented and tables are constructed for selecting the sampling parameters. The performance/discriminating power of the Polya single sampling plans is also discussed by determining the operating characteristic curve.

Suggested Citation

  • Rajagopal K. & Loganathan A. & Vijayaraghavan R., 2009. "Selection of Bayesian Single Sampling Attributes Plans Based on Polya Distribution," Stochastics and Quality Control, De Gruyter, vol. 24(2), pages 179-193, January.
    • Handle: RePEc:bpj:ecqcon:v:24:y:2009:i:2:p:179-193:n:2
    DOI: 10.1515/EQC.2009.179
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    Citations

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    Cited by:

    1. Vijayaraghavan R. & Sakthivel K. M., 2011. "Chain Sampling Inspection Plans Based on Bayesian Methodology," Stochastics and Quality Control, De Gruyter, vol. 26(2), pages 173-187, January.
    2. Vijayaraghavan R. & Sakthivel K. M., 2010. "Selection of Bayesian Double Sampling Inspection Plans by Attributes with Small Acceptance Numbers," Stochastics and Quality Control, De Gruyter, vol. 25(2), pages 207-220, January.
    3. Loganathan A. & Vijayaraghavan R. & Rajagopal K., 2010. "Designing Single Sampling Plans by Variables Using Predictive Distribution," Stochastics and Quality Control, De Gruyter, vol. 25(2), pages 301-316, January.

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