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Semiparametric Maximum Likelihood for Nonlinear Regression with Measurement Errors

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  • Eun-Young Suh
  • Daniel W. Schafer

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  • Eun-Young Suh & Daniel W. Schafer, 2002. "Semiparametric Maximum Likelihood for Nonlinear Regression with Measurement Errors," Biometrics, The International Biometric Society, vol. 58(2), pages 448-453, June.
    • Handle: RePEc:bla:biomet:v:58:y:2002:i:2:p:448-453
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    File URL: http://hdl.handle.net/10.1111/j.0006-341X.2002.00448.x
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    References listed on IDEAS

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    1. Daniel W. Schafer, 2001. "Semiparametric Maximum Likelihood for Measurement Error Model Regression," Biometrics, The International Biometric Society, vol. 57(1), pages 53-61, March.
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    Cited by:

    1. Yanqin Feng & Ling Ma & Jianguo Sun, 2015. "Regression Analysis of Current Status Data Under the Additive Hazards Model with Auxiliary Covariates," Scandinavian Journal of Statistics, Danish Society for Theoretical Statistics;Finnish Statistical Society;Norwegian Statistical Association;Swedish Statistical Association, vol. 42(1), pages 118-136, March.

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