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Development of Low-Cost Non-Contacting Thickness of Material Measurement Instrument

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  • M. O. Osinowo

    (Department of Physical Sciences, Redeemer’s University, Ede, Nigeria)

Abstract

The goal of the research was to develop a low-cost, non-contact tool for determining material thickness. The non-contacting thickness is made up of the time-of-flight (ToF) distance sensor, liquid crystal display, and microprocessor. The substance being tested is placed in a rectangular wooden frame, with the ToF distance sensor positioned beneath the upward end of the rectangular frame. The sensor has a dimension of 400 mm range and a resolution of 1 mm. when the device is tested with various materials thickness value is equal to value obtained when used with high accurate precision Vanier caliper. The SD determined is 0.67 is very low that indicate that value tends close to true value.

Suggested Citation

  • M. O. Osinowo, 2023. "Development of Low-Cost Non-Contacting Thickness of Material Measurement Instrument," International Journal of Research and Innovation in Applied Science, International Journal of Research and Innovation in Applied Science (IJRIAS), vol. 8(6), pages 186-190, June.
    • Handle: RePEc:bjf:journl:v:8:y:2023:i:6:p:186-190
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