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A Review of Artificial Intelligence Techniques for Quality Control in Semiconductor Production

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  • Rajat Suvra Das

Abstract

Purpose: Exploring AI techniques to improve the quality control of semiconductor production brings numerous advantages, such as enhanced precision, heightened efficiency, and early detection of issues, cost reduction, continuous enhancement, and a competitive edge. These benefits establish this area of research and its practical application in the semiconductor industry as valuable and worthwhile. Methodology: It aims to highlight the advancements, methodologies employed, and outcomes obtained thus far. By scrutinizing the current state of research, the primary objective of this paper is to identify significant challenges and issues associated with AI approaches in this domain. These challenges encompass data quality and availability, selecting appropriate algorithms, interpreting AI models, and integrating them with existing production systems. It is vital for researchers and industry professionals to understand these challenges to effectively address them and devise effective solutions. Moreover, it aims to lay the groundwork for future researchers, offering them a theoretical framework to devise potential solutions for enhancing quality control in semiconductor production. This review aims to drive a research on the semi-conductor production with the AI techniques to enhance the Quality control. Findings: The main findings to offer research is more efficient and accurate approach compared to traditional manual methods, leading to improved product quality, reduced costs, and increased productivity. Armed with this knowledge, future researchers can design and implement innovative AI-driven solutions to enhance quality control in semiconductor production. Unique contribution to theory, policy and practice: Overall, the theoretical foundation presented in this paper will aid researchers in developing novel solutions to improve quality control in the semiconductor industry, ultimately leading to enhanced product reliability and customer satisfaction.

Suggested Citation

  • Rajat Suvra Das, 2024. "A Review of Artificial Intelligence Techniques for Quality Control in Semiconductor Production," International Journal of Computing and Engineering, CARI Journals Limited, vol. 5(3), pages 33-45.
    • Handle: RePEc:bhx:ojijce:v:5:y:2024:i:3:p:33-45:id:1815
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    File URL: https://carijournals.org/journals/index.php/IJCE/article/view/1815/2189
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