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Reproducible flaws unveil electrostatic aspects of semiconductor electrochemistry

Author

Listed:
  • Yan B. Vogel

    (Curtin University)

  • Long Zhang

    (Curtin University
    University of Wollongong)

  • Nadim Darwish

    (Curtin University)

  • Vinicius R. Gonçales

    (The University of New South Wales)

  • Anton Le Brun

    (Australian Nuclear Science and Technology Organization (ANSTO))

  • J. Justin Gooding

    (The University of New South Wales)

  • Angela Molina

    (Universidad de Murcia)

  • Gordon G. Wallace

    (University of Wollongong)

  • Michelle L. Coote

    (Australian National University)

  • Joaquin Gonzalez

    (Universidad de Murcia)

  • Simone Ciampi

    (Curtin University)

Abstract

Predicting or manipulating charge-transfer at semiconductor interfaces, from molecular electronics to energy conversion, relies on knowledge generated from a kinetic analysis of the electrode process, as provided by cyclic voltammetry. Scientists and engineers encountering non-ideal shapes and positions in voltammograms are inclined to reject these as flaws. Here we show that non-idealities of redox probes confined at silicon electrodes, namely full width at half maximum

Suggested Citation

  • Yan B. Vogel & Long Zhang & Nadim Darwish & Vinicius R. Gonçales & Anton Le Brun & J. Justin Gooding & Angela Molina & Gordon G. Wallace & Michelle L. Coote & Joaquin Gonzalez & Simone Ciampi, 2017. "Reproducible flaws unveil electrostatic aspects of semiconductor electrochemistry," Nature Communications, Nature, vol. 8(1), pages 1-9, December.
    • Handle: RePEc:nat:natcom:v:8:y:2017:i:1:d:10.1038_s41467-017-02091-1
    DOI: 10.1038/s41467-017-02091-1
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