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Three-dimensional surface topography of graphene by divergent beam electron diffraction

Author

Listed:
  • Tatiana Latychevskaia

    (Physics Department of the University of Zurich)

  • Wei-Hao Hsu

    (Institute of Physics, Academia Sinica
    National Tsing Hua University)

  • Wei-Tse Chang

    (Institute of Physics, Academia Sinica)

  • Chun-Yueh Lin

    (Institute of Physics, Academia Sinica)

  • Ing-Shouh Hwang

    (Institute of Physics, Academia Sinica
    National Tsing Hua University)

Abstract

There are only a handful of scanning techniques that can provide surface topography at nanometre resolution. At the same time, there are no methods that are capable of non-invasive imaging of the three-dimensional surface topography of a thin free-standing crystalline material. Here we propose a new technique—the divergent beam electron diffraction (DBED) and show that it can directly image the inhomogeneity in the atomic positions in a crystal. Such inhomogeneities are directly transformed into the intensity contrast in the first-order diffraction spots of DBED patterns and the intensity contrast linearly depends on the wavelength of the employed probing electrons. Three-dimensional displacement of atoms as small as 1 angstrom can be detected when imaged with low-energy electrons (50–250 eV). The main advantage of DBED is that it allows visualization of the three-dimensional surface topography and strain distribution at the nanometre scale in non-scanning mode, from a single shot diffraction experiment.

Suggested Citation

  • Tatiana Latychevskaia & Wei-Hao Hsu & Wei-Tse Chang & Chun-Yueh Lin & Ing-Shouh Hwang, 2017. "Three-dimensional surface topography of graphene by divergent beam electron diffraction," Nature Communications, Nature, vol. 8(1), pages 1-7, April.
    • Handle: RePEc:nat:natcom:v:8:y:2017:i:1:d:10.1038_ncomms14440
    DOI: 10.1038/ncomms14440
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